Equipment

Alpha analyzer Alpha analyzer NovocontrolTechnologies
Vector Network Analyzer / Spectrum Analyzer

Automatic electrochemical analyzer

Automatic electrochemical analyzer Metrohm 797 VA Computrace, 889 IC Sample Center, 846 Dosing Interface
Technology

Baseband analyzer

Baseband analyzer Rohde&Schwarz FMU 36
Electronic measuring instrument

CNTs deposition chamber

CNTs deposition chamber
Technology

Detector WDX Oxford WAVE 500 INCA
Other Analyzer / Spectroscope

ELISA reader and incubator

ELISA reader and incubator TECAN infinite M200 PRO
Microplate Readers

FT-NIR spectrometer

FT-NIR spectrometer Nicolet 8700
Vector Network Analyzer / Spectrum Analyzer

Ion sputtering
Technology

Isolator workplace

Isolator workplace Modular 3-glove box JACOMEX
Technology

MALDI-TOF/FOF Bruker MALDI-TOF/FOF
Other Analyzer / Spectroscope

Optical Spectrum Analyzer

Optical Spectrum Analyzer ROHDE & SCHWARZ ADCMT 8341
Vector Network Analyzer / Spectrum Analyzer

PXI Module Keithley
Electronic measuring instrument

Real time cell analyzer

Real time cell analyzer Roche xCELLigence RTCA DP
Real time cell analyzer

Real time PCR Eppendorf Mastercycler
Real time PCR

Scanning electron beam microscope

Scanning electron beam microscope Tescan LYRA XMU
Surface analyzer

SCS Parylene Deposition System SCS Labcoater 2 PDS
Technology

Self assembly monolayer 1

Self assembly monolayer 1
Technology

Self assembly monolayer 2

Self assembly monolayer 2
Technology

Sensor network 6LoWPAN 2,4GHz
Active Network Component

Signal source analyzer

Signal source analyzer Rohde&Schwarz FSV
Electronic measuring instrument

Source Measure Units

Source Measure Units Keithley 4200-SCS
Electronic measuring instrument

Stylus profilometry Bruker DektakXT
Surface analyzer

System for sample preparation Analytical balance Kern ABJ 320-4, milling machine LPKF ProtoMat S43, climate chamber BINDER KMF115
Technology

Vacuum furnace
Technology

XEF2 etching system

XeF2 etching system
Technology