A four-port network analyzer Agilent E5071C ENA Series is intended for measurement of transmission structures in high-speed electronic systems, such as interconnects in integrated circuits and multi-chip modules, digital printed circuit boards, connectors or computer boards. It is able to characterize the parameters in frequency domain by measuring the scattering parameters (in the range 300 kHz to 20 GHz). In connection with buit-in E5071C-TDR Enhanced Time Domain Analysis, it can also be used as a time domain reflectometer for the analysis of reflections on inhomogeneities and unmatched loads, including the eye diagram display. It can thus help with the signal integrity analysis in mixed electronic circuits design. In connection with built-in E5071C-008 Frequency Offset Mode, the equipment can also be used for mixer and frequency converter circuit designs. The optional E5092A Configurable Multiport Test Set enables multiport measurements (up to 22 ports) of other hardware parts of wireless communication systems.