DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Local topography of optoelectronic substrates prepared by dry plasma etching process. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 9442081-9442086. ISSN: 0277- 786X.

DALLAEVA, D.; TOMANEK, P.; PROKOPYEVA, E.; KASPAR, P.; GRMELA, L.; SKARVADA, P. AFM imaging of natural optical structures. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 944209- 1 (944209-8 p.)ISSN: 0277- 786X.

DALLAEVA, D.; RAMAZANOV, S.; RAMAZANOV, G.; AKHMEDOV, R.; TOMÁNEK, P. Characterizing SiC- AlN semiconductor solid solutions with indirect and direct bandgaps. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501R- 1 (94501R-6 p.)ISSN: 0277- 786X.

DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501O- 1 (94501O-7 p.)ISSN: 0277- 786X.

DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; RAMAZANOV, S. Interferometry and Atomic force microscopy of substrates for optoelectronics proceeded by dry plasma etching. Proceedings. The Computer Security Foundations Workshop III, 2014, vol. 2014, no. 1, p. 283-287. ISSN: 1063- 6900.

ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. Applied Surface Science, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169- 4332.

DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 2014, vol. 312, no. 312, p. 81-86. ISSN: 0169- 4332.

DALLAEVA, D.; TOMÁNEK, P.; SAFARALIEV, G.; KARDASHOVA, G. High- Density Ceramic Materials on the Basis of Silicon Carbide. Key Engineering Materials (print), 2014, vol. 592- 593, no. 592, p. 397-400. ISSN: 1013- 9826.

DALLAEVA, D.; ŠKARVADA, P.; TOMÁNEK, P.; SMITH, S.; SAFARALIEV, G.; BILALOV, B.; GITIKCHIEV, M.; KARDASHOVA, G. Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF- activated nitrogen plasma. Thin Solid Films, 2013, vol. 526, no. 526, p. 62-96. ISSN: 0040- 6090.

TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes- Investigation of defects in monocrystalline silicon solar cells. WORLD JOURNAL OF ENGINEERING, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708- 5284.

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277- 786X.

DALLAEVA, D.; TOMÁNEK, P. Substrate Preparation for Manufacturing of Aluminum Nitride Layers. ElectroScope - http://www.electroscope.zcu. cz, 2013, vol. 2013, no. 5, p. 1-5. ISSN: 1802- 4564.

DALLAEVA, D. Surface roughness of aluminum nitride epilayers prepared by magnetron sputtering. In Proceedings of the 20th conference. Volume 3. Brno: LITERA Brno, 2014. p. 120-124. ISBN: 978-80-214-4922- 0.

DALLAEVA, D.; RAMAZANOV, S.; KLAMPÁR, M.; TOMÁNEK, P. Study of Dry Etching Process for Substrates Preparation. In International Interdisciplinary PhD Workshop 2013. Brno: Brno University of Technology, 2013. p. 60-64. ISBN: 978-80-214-4759- 2.

KLAMPÁR, M.; LIEDERMANN, K.; SPOHNER, M.; DALLAEVA, D. Dielectric properties of epoxides with Al2O3nanofier and their exposureto acceerated ageing. In IIPhDW 2013 Proceedings. Brno: Brno, 2013. p. 100-103. ISBN: 978-80-214-4759- 2.

BOGATYREVA, N.; BARTLOVÁ, M.; AUBRECHT, V.; ŠKARVADA, P.; DALLAEVA, D. APPROXIMATE CALCULATIONS OF RADIATION EMISSION FROM SF6 ARC PLASMAS WITH CU VAPOURS. In Proceedings of XX Symposium on Physics of Switching Arc, Invited Lectures and Contributed Papers. Brno- Letohrad: VUT v Brně, OEZ Letohrad, 2013. p. 92-95. ISBN: 978-80-214-4753- 0.

KLAMPÁR, M.; LIEDERMANN, K.; SPOHNER, M.; ŠKARVADA, P.; DALLAEVA, D.; KOBRTEK, J. DIELECTRIC PROPERTIES OF EPOXY RESINS WITH OXIDE NANOFILLERS AND THEIR ACCELERATED AGEING. In IEEE Catalog Number CFP13EEI- USB. Ottawa, Ontario, Canada: Ottawa, Ontario, 2013. p. 159-164. ISBN: 978-1-4673-4739- 6.

DALLAEVA, D. Biological solids of the sewage- purification facilities. In Proceedings of the International Summer School on Application of Scanning Probe Microscopy in Life Sciences, Soft Matter and Nanofabrication. Aalborg 2013: River Publishers, 2013. p. 1 (1 s.). ISBN: 9788793102330.

DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. p. 33-34. ISBN: 978-80-223-3501- 0.

TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; DALLAEVA, D. Optoelectronic diagnostics of defects in solar cell structures. In Optica and Measurement 2012. Prague: Institute of plasma Physics, 2012. p. 137-140. ISBN: 978-80-87026-02- 1.

DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B. Scanning electron microscopy of the thin layers of silicon carbide- aluminum nitride solid solution formatted by sublimation epitaxy. In Optics and Measurement 2012. first edition. Prague 8: Institute of Plasma Physics AS CR, v.v.i. - TOPTEC, 2012. p. 5-8. ISBN: 978-80-87026-02- 1.

ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D. Solar Cell Structure Defects and Cracks. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: 2012. p. 507-514. ISBN: 978-5-905576-18- 8.

MACKŮ, R.; ŠICNER, J.; DALLAEVA, D. An Experimentally Based Characterization of Solar Cell Structure Defects by Means of Noise and Optical Activities Analysis. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: Research Center for power engineering progblems of the russian academy of sciences, 2012. p. 499-506. ISBN: 978-5-905576-18- 8.

DALLAEVA, D.; SAFARALIEV, G.; BILALOV, B.; KARDASHOVA, G.; TOMÁNEK, P. Formation and study of SiC and AlN epilayers. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. p. 111-115. ISBN: 978-80-214-4539- 0.

DALLAEVA, D.; BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; TOMÁNEK, P.; ARKHIPOV, A. Investigation of the ion sputtering process of the (SiC)1-x(AlN) x ceramic target. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. FIRST. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. p. 49-53. ISBN: 978-80-214-4539- 0.

ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; TOMÁNEK, P. Local diagnostics of defects in monocrystalline silicon solar cells Local diagnostics of defects in monocrystalline silicon solar cells. In NFO-12, vol. 1 - Invited talks and oral presentations. Donostia- San Sebastian: nanoGUNE, 2012. p. 43-44.