The 4200-SCS Semiconductor Characterization System Model allows the measurement of DC and pulse characteristics, a real-time display of graphs and high-precision analysis with a resolution below fA range. The 4200-SCS system offers the latest functions available within a fully integrated system for the measurement of semiconductor characteristics, including a full PC with Windows OS and HDD with sufficient capacity. The C-V module allows carrying out C-V measurements as easily as those of DC I-V characteristics
Impulse measurement options for the measurement of I-V characteristics for advanced tests of semiconductor devices. The PC control makes possible a fast test setting, a rapid data analysis, graph plotting and printing. The HDD provides sufficient space for test results storage.